Production range of microscopy detection units covers detectors for scanning (SEM) and transmission (TEM) electron microscopy.
| SEM DETECTORS | ||
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| SE (secondary electron) detection |
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| BSE (back-scattered electrons) detection |
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| CL (cathodoluminescence) |
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| TEM DETECTORS | ||
| STEM detectors |
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| TEM detectors |
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Crytur cooperates closely with customers on the design and development and can also deliver special detector designs according to the custommers needs。
